• DocumentCode
    966729
  • Title

    Magnetic hysteresis characteristics in Fe-SiO2 multilayered films

  • Author

    Honda, S. ; Ohtsu, M. ; Kusuda, T.

  • Author_Institution
    Dept. of Phys. Electron., Hiroshima Univ., Japan
  • Volume
    25
  • Issue
    5
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    3848
  • Lastpage
    3850
  • Abstract
    The crystallinity and magnetic properties of Fe-SiO2 multilayered films are examined in the range of 7-300 Å Fe layer thickness, dFe, and 2-250 Å SiO2 layer thickness, d(SiO2). The saturation magnetization decreases steeply with dFe below 30 Å for films with d(SiO2)⩾6.3 Å owing to the change in crystallinity of the Fe layers. When d(SiO2) decreases, the magnetic hysteresis loop changes from one characteristic of in-plane magnetization to one characteristic of perpendicular magnetization as a result of the induced perpendicular anisotropy, Ku. The change in K u is explained by the variation of the magnetostatic energy stored in the layer boundaries
  • Keywords
    induced anisotropy (magnetic); iron; magnetic hysteresis; magnetic thin films; silicon compounds; Fe-SiO2 multilayer films; crystallinity; induced perpendicular anisotropy; magnetic hysteresis loop; magnetostatic energy; saturation magnetisation; Crystallization; Electrons; Iron; Magnetic films; Magnetic hysteresis; Magnetic properties; Radio frequency; Saturation magnetization; Sputtering; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.42453
  • Filename
    42453
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=966729