• DocumentCode
    966758
  • Title

    Reliable low-power digital signal processing via reduced precision redundancy

  • Author

    Shim, Byonghyo ; Sridhara, Srinivasa R. ; Shanbhag, Naresh R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
  • Volume
    12
  • Issue
    5
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    497
  • Lastpage
    510
  • Abstract
    In this paper, we present a novel algorithmic noise-tolerance (ANT) technique referred to as reduced precision redundancy (RPR). RPR requires a reduced precision replica whose output can be employed as the corrected output in case the original system computes erroneously. When combined with voltage overscaling (VOS), the resulting soft digital signal processing system achieves up to 60% and 44% energy savings with no loss in the signal-to-noise ratio (SNR) for receive filtering in a QPSK system and the butterfly of fast Fourier transform (FFT) in a WLAN OFDM system, respectively. These energy savings are with respect to optimally scaled (i.e., the supply voltage equals the critical voltage V/sub dd-crit/) present day systems. Further, we show that the RPR technique is able to maintain the output SNR for error rates of up to 0.09/sample and 0.06/sample in an finite impulse response filter and a FFT block, respectively.
  • Keywords
    CMOS digital integrated circuits; digital signal processing chips; fast Fourier transforms; integrated circuit noise; integrated circuit reliability; low-power electronics; quadrature phase shift keying; redundancy; CMOS; FFT; WLAN OFDM system; algorithmic noise-tolerance; digital signal processing; fast Fourier transform; reduced precision redundancy; reliable low power digital signal processing; signal-to-noise ratio; voltage overscaling; Digital filters; Digital signal processing; Fast Fourier transforms; Filtering; Noise reduction; Quadrature phase shift keying; Redundancy; Signal processing algorithms; Signal to noise ratio; Voltage;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2004.826201
  • Filename
    1291428