A Novel Method for Millimeter-Wave On-Wafer Characterization of Reflect Patch Antennas

Author

Farinelli, Paola ; Vähä-Heikkilä, Tauno ; Säily, Jussi ; Sorrentino, Roberto ; Tuovinen, Jussi

Author_Institution

Dipt. di Ingegneria Elettronica e dell´´Informazione, Univ. di Perugia

Volume

5

Issue

1

fYear

2006

Firstpage

556

Lastpage

558

Abstract

This letter presents a simple new measurement procedure to test single elements of electrically steerable reflectarray antennas. The method allows one to measure the reflection coefficient of reflector antenna elementary cells consisting of resonating elements and phase or amplitude control circuits (MMIC, RF-MEMS, ferroelectric, etc.). The measurement system can be used for verifying the correct functionalities and steering capabilities of antenna arrays without the need of expensive and time consuming full antenna measurements. The method has been verified at V-band on a LTCC patch antenna at V-band (57.2 GHz). The measurement results are presented in comparison with the theory, showing very good agreement

Keywords

antenna testing; beam steering; microstrip antenna arrays; millimetre wave antenna arrays; millimetre wave measurement; phase control; reflector antennas; 57.2 GHz; LTCC patch antenna; MMIC; RF-MEMS; V-band; amplitude control circuit; antenna arrays; electrically steerable reflectarray antennas; ferroelectric circuit; millimeter-wave on-wafer characterization; phase control circuit; reflect patch antennas; reflection coefficient; reflector antenna elementary cells; resonating elements; Antenna measurements; Circuit testing; Electric variables measurement; Millimeter wave circuits; Millimeter wave measurements; Millimeter wave technology; Patch antennas; Phase measurement; Reflector antennas; Time measurement; On-wafer; phase shifter; phased array; reflectarray;

fLanguage

English

Journal_Title

Antennas and Wireless Propagation Letters, IEEE

Publisher

ieee

ISSN

1536-1225

Type

jour

DOI

10.1109/LAWP.2006.889554

Filename

4064870