• DocumentCode
    972233
  • Title

    Field dependence of mobility in Al0.2Ga0.8As/GaAs heterojunctions at very low fields

  • Author

    Drummond, T.J. ; Keever, M. ; Kopp, W. ; Morko¿¿, H. ; Hess, K. ; Streetman, B.G. ; Cho, Andrew Y.

  • Author_Institution
    University of Illinois, Department of Electrical Engineering, Coordinated Science Laboratory, Urbana, USA
  • Volume
    17
  • Issue
    15
  • fYear
    1981
  • Firstpage
    545
  • Lastpage
    547
  • Abstract
    Multiple-period (Al, Ga)As/GaAs modulation doped heterojunction structures have been grown with molecular beam epitaxy. Electron mobilities of about 200 000 cm2/Vs at 10 K and 90000 cm2/Vs at 77 K with associated sheet carrier concentrations of about 2×1012 cm¿2 have been observed. The current parallel to the interfaces for low electric fields was examined as a function of lattice temperature. The electron mobility has been observed to be strongly dependent on the strength of the electric field, and hot electron effects were observable at a field as low as 10 V/cm. To our knowledge this is the first report of hot electron phenomena in GaAs at such small fields.
  • Keywords
    III-V semiconductors; aluminium compounds; carrier mobility; gallium arsenide; hot carriers; p-n heterojunctions; Al0.2Ga0.8As-GaAs heterojunction; electron mobility; field dependence; hot electron effects; lattice temperature; low electric fields; modulation doped heterojunction structures; molecular beam epitaxy; sheet carrier concentrations;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19810381
  • Filename
    4245855