DocumentCode
977491
Title
Characterization of spiral inductors with patterned floating structures
Author
Chang, Chiaming Alex ; Tseng, Sung-Pi ; Chuang, Jun Yi ; Jiang, Shiue-Shr ; Yeh, J. Andrew
Author_Institution
Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume
52
Issue
5
fYear
2004
fDate
5/1/2004 12:00:00 AM
Firstpage
1375
Lastpage
1381
Abstract
The impact of two different types of floating patterns on spiral inductors was investigated. Both patterned trench isolation with a floating p/n junction and floating metal poles were implemented underneath reference spiral inductors. All three types of inductors have an identical spiral geometry. Combination of patterned trench isolation with a floating p/n junction increases maximum quality factor (Qmax) by 17% compared to the reference inductors. The floating metal poles enable adjustment of the frequency at Qmax (fmax) without hampering the Qmax. A ladder-type lump-element model was employed to analyze inductor performance after it was demonstrated to precisely capture behavior of all three inductors. Enhancement of the quality factor due to patterned trench isolation with a floating p/n junction was found to result from an increment of effective resistivity in substrates. Reduction of the frequency fmax due to the floating metal poles was caused by increasing effective coupling capacitance between the spiral inductors and substrate.
Keywords
Q-factor; capacitance; inductors; ladder networks; microwave devices; p-n junctions; coupling capacitance; effective resistivity; floating metal poles; floating p/n junction; ladder-type lump-element model; patterned floating structures; patterned trench isolation; spiral geometry; spiral inductors; CMOS technology; Conductivity; Copper; Energy loss; Inductors; Q factor; Radio frequency; Silicon; Spirals; Substrates;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2004.827002
Filename
1295135
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