• DocumentCode
    977694
  • Title

    Electrical design optimization of single-mode tunnel-junction-based long-wavelength VCSELs

  • Author

    Mehta, Manish ; Feezell, Danny ; Buell, David A. ; Jackson, Andrew W. ; Coldren, Larry A. ; Bowers, John E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA
  • Volume
    42
  • Issue
    7
  • fYear
    2006
  • fDate
    7/1/2006 12:00:00 AM
  • Firstpage
    675
  • Lastpage
    682
  • Abstract
    We present principles for tunnel-junction (TJ) design optimization for use in intracavity contacted long-wavelength vertical-cavity surface-emitting lasers (LW-VCSELs). Using the WKB approximation, we find that layer thicknesses of 10 nm on the n++ side and 10 nm on the p++ side are large enough to maximize quantum tunneling probability and small enough to yield low optical free-carrier absorption loss. We also conjecture that our experimental test structures and actual devices have far lower active acceptor concentration than we expect based on an analytical model. Finally, we calculate the necessary doping levels to enable single-mode operation of LW-VCSELs and incorporate these conditions into a complete optimized model of our VCSELs. Based on optimal I-V curves, we can expect an increase in single-mode output power from 2 to 3.5 mW
  • Keywords
    III-V semiconductors; WKB calculations; aluminium compounds; gallium arsenide; indium compounds; laser cavity resonators; laser modes; optical losses; probability; semiconductor doping; semiconductor lasers; surface emitting lasers; 10 nm; 2 to 3.5 mW; AlInAs-InP; AlInGaAs; VCSEL; WKB approximation; active acceptor concentration; doping levels; electrical design optimization; intracavity contacted lasers; long-wavelength lasers; optical free-carrier absorption loss; optimal I-V curves; quantum tunneling probability; single-mode lasers; tunnel-junction design; Absorption; Analytical models; Contacts; Design optimization; Doping; Optical losses; Surface emitting lasers; Testing; Tunneling; Vertical cavity surface emitting lasers; AlInAs; AlInGaAs; InP; current spreading; long-wavelength; tunnel diode; tunnel junction; vertical-cavity surface-emitting laser (VCSEL);
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2006.876713
  • Filename
    1643359