• DocumentCode
    985608
  • Title

    Control of locally testable duplex system for large-scale implementation

  • Author

    Lombardi, Floriana

  • Author_Institution
    Texas Technical University, Department of Electrical Engineering/Computer Science, Lubbock, USA
  • Volume
    19
  • Issue
    10
  • fYear
    1983
  • Firstpage
    392
  • Lastpage
    393
  • Abstract
    In the letter the control of a duplex system is presented. This is characterised by the locality of the testing devices and by easy expandability to a larger system with large-scale attributes. The control suggests the viability of a VLSI chip implementation by a modular design.
  • Keywords
    computer architecture; computer testing; fault tolerant computing; large scale integration; VLSI chip implementation; complete architecture; computer testing; duplex system; fault tolerant systems; local testing; modular design; system control;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19830271
  • Filename
    4247725
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=985608