DocumentCode
990096
Title
Wide-span optical frequency comb generator for accurate optical frequency difference measurement
Author
Kourogi, Motonobu ; Nakagawa, Ken Ichi ; Ohtsu, Motoichi
Author_Institution
Grad. Sch. of Sci. & Eng., Tokyo Inst. of Technol., Yokohama, Japan
Volume
29
Issue
10
fYear
1993
fDate
10/1/1993 12:00:00 AM
Firstpage
2693
Lastpage
2701
Abstract
An optical frequency comb (OFC) generator was realized for accurate optical frequency difference measurement of 1.5 μm wavelength semiconductor lasers by using a high frequency LiNbO3 electrooptic phase modulator which was installed in a Fabry-Perot cavity. It was confirmed that the span of the OFC was wider than 4 THz. By using semiconductor lasers whose spectrum linewidths were narrowed to 1 kHz and a sensitive optical balanced-mixer-receiver for measuring beat signal between the sideband of the comb and the laser, we demonstrated a frequency difference measurement up to 0.5 THz with a signal-to-noise ratio higher than 61 dB, and a heterodyne optical phase locking with a heterodyne frequency of 0.5 THz in which the residual phase error variance was less than 0.01 rad2. The maximum measurable frequency difference, which was defined as the sideband frequency with the signal-to-noise ratio of 0 dB, was estimated to be 4 THz
Keywords
electro-optical devices; laser variables measurement; lithium compounds; optical modulation; phase modulation; semiconductor lasers; spectral line breadth; 0.5 THz; 1.5 mum; 4 THz; Fabry-Perot cavity; LiNbO3; LiNbO3 electrooptic phase modulator; accurate optical frequency difference measurement; beat signal; heterodyne optical phase locking; high frequency; optical frequency difference measurement; residual phase error variance; semiconductor lasers; sensitive optical balanced-mixer-receiver; sideband frequency; signal-to-noise ratio; spectrum linewidths; wide-span optical frequency comb generator; Frequency estimation; Frequency measurement; Lasers and electrooptics; Optical mixing; Optical modulation; Optical sensors; Phase measurement; Semiconductor lasers; Signal to noise ratio; Wavelength measurement;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.250392
Filename
250392
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