• DocumentCode
    992761
  • Title

    Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan

  • Author

    Boyer, A. ; Bendhia, S. ; Sicard, E.

  • Author_Institution
    Electron. Dept., Toulouse
  • Volume
    43
  • Issue
    1
  • fYear
    2007
  • Firstpage
    15
  • Lastpage
    16
  • Abstract
    A susceptibility characterisation test for integrated circuits using a miniature magnetic near-field probe is described. The method is efficient up to a frequency of 6 GHz and maps immunity to radiated fields
  • Keywords
    immunity testing; integrated circuit testing; probes; electromagnetic susceptibility; integrated circuits; magnetic near-field probe; near-field scan; radiated fields immunity; susceptibility characterisation test;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    4068467
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=992761