• DocumentCode
    992876
  • Title

    Producing reliable initialization and test of sequential circuits with pseudorandom vectors

  • Author

    Soufi, M. ; Savaria, Y. ; Darlay, F. ; Kaminska, B.

  • Author_Institution
    Ecole Polytech., Montreal, Que., Canada
  • Volume
    44
  • Issue
    10
  • fYear
    1995
  • fDate
    10/1/1995 12:00:00 AM
  • Firstpage
    1251
  • Lastpage
    1256
  • Abstract
    In this paper, the initialization of sequential circuits using pseudorandom input patterns is addressed. An extended Markov chain model that covers the initialization phase is proposed. This model supports the theoretical framework used to demonstrate that sequential circuits can be initialized with pseudorandom vectors. This leads to a uniform BIST approach in which initialization and testing are performed together with a single pseudorandom generator
  • Keywords
    Markov processes; built-in self test; logic testing; sequential circuits; extended Markov chain model; initialization phase; pseudorandom vectors; reliable initialization; sequential circuits testing; single pseudorandom generator; uniform BIST approach; Automatic testing; Built-in self-test; Circuit testing; Flip-flops; Integrated circuit interconnections; Microprocessors; Multiprocessor interconnection networks; Performance evaluation; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.467701
  • Filename
    467701