DocumentCode
996572
Title
The Impact of Radiation-Induced Failure Mechanisms in Electronic Components on System Reliability
Author
Mayer, Donald C. ; Koga, Rokutaro ; Womack, J.M.
Author_Institution
Aerosp. Corp., El Segundo
Volume
54
Issue
6
fYear
2007
Firstpage
2120
Lastpage
2124
Abstract
A methodology is described to incorporate destructive radiation effects into the reliability estimation for a space system. Examples are presented to illustrate how on-orbit system reliability can be estimated from test data from radiation-sensitive parts.
Keywords
aerospace instrumentation; radiation effects; destructive radiation effects; electronic components; on-orbit system reliability; radiation-induced failure mechanisms; space system; Aerospace electronics; Electronic components; Failure analysis; MOSFETs; Power generation; Radiation effects; Reliability; Space technology; Space vehicles; System testing; Destructive radiation effects; reliability; single-event burnout; single-event effects; single-event latchup;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2007.910294
Filename
4395057
Link To Document