• DocumentCode
    997892
  • Title

    A bidirectional loop-to-loop transfer gate for ion-implanted bubble devices with on chip cache organization

  • Author

    Urai, H. ; Matsuyama, K. ; Yoshimi, K.

  • Author_Institution
    Microelectronics Research Labs., NEC Corporation, Kawasaki, Japan
  • Volume
    19
  • Issue
    5
  • fYear
    1983
  • fDate
    9/1/1983 12:00:00 AM
  • Firstpage
    1847
  • Lastpage
    1849
  • Abstract
    A new bidirectional loop-to-loop transfer gate has been designed with an N-shape conductor stripe. It is characterized for use with ion-implanted bubble devices with on chip cache organization (OCCO). The gate is operated in 4 modes for He+ ion implanted devices with 1 μm diameter bubbles. Only one of the 4 transfer modes is found to be usable for bidirectional transfer operation, according to bubble data recurrence considerations between cache and storage loops, and according to operation margin stability. Composite operation margins are obtained as 25 Oe for greater than 55 Oe in-plane drive field, even for consecutive data transfer. The bidirectional transfer gate makes possible ion-implanted bubble devices for high access performance, even in high bit density large capacity memories.
  • Keywords
    Cache memories; Ion implantation; Magnetic bubble memories; Cache storage; Conductors; Difference equations; Microelectronics; National electric code; Stability;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1983.1062719
  • Filename
    1062719