DocumentCode
997892
Title
A bidirectional loop-to-loop transfer gate for ion-implanted bubble devices with on chip cache organization
Author
Urai, H. ; Matsuyama, K. ; Yoshimi, K.
Author_Institution
Microelectronics Research Labs., NEC Corporation, Kawasaki, Japan
Volume
19
Issue
5
fYear
1983
fDate
9/1/1983 12:00:00 AM
Firstpage
1847
Lastpage
1849
Abstract
A new bidirectional loop-to-loop transfer gate has been designed with an N-shape conductor stripe. It is characterized for use with ion-implanted bubble devices with on chip cache organization (OCCO). The gate is operated in 4 modes for He+ ion implanted devices with 1 μm diameter bubbles. Only one of the 4 transfer modes is found to be usable for bidirectional transfer operation, according to bubble data recurrence considerations between cache and storage loops, and according to operation margin stability. Composite operation margins are obtained as 25 Oe for greater than 55 Oe in-plane drive field, even for consecutive data transfer. The bidirectional transfer gate makes possible ion-implanted bubble devices for high access performance, even in high bit density large capacity memories.
Keywords
Cache memories; Ion implantation; Magnetic bubble memories; Cache storage; Conductors; Difference equations; Microelectronics; National electric code; Stability;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062719
Filename
1062719
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