• DocumentCode
    999304
  • Title

    Teradyne´s J967 VLSI Test System: Getting VLSI to the Market on Time

  • Author

    Ponik, Wayne

  • Author_Institution
    Teradyne, Inc.
  • Volume
    2
  • Issue
    6
  • fYear
    1985
  • Firstpage
    57
  • Lastpage
    62
  • Abstract
    The J967 is the newest of Teradyne´s J900 series of VLSI test systems. It provides flxible timing and formating; fact accurate parametric tests; and automatic calibration to devices with fewer than 200 leads and bus speeds of up to 20 MHz. The 36 timing generators and 1024 timing sets reduce the need for multiple passes or multiple programs to test a device. The J967´s intergrated software includes the Berkeley 4.2BSD Unix operating system, T900 test language, automatic data loging, a test analysis program, and Testsim, a software simulation of the J967 for offline debuging.
  • Keywords
    Automatic control; Automatic testing; Calibration; Clocks; Computer architecture; Power supplies; Production; System testing; Timing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1985.294800
  • Filename
    4069701