• Title of article

    Influence of substrate surfaces on the growth of organic films

  • Author/Authors

    A Das، نويسنده , , G Salvan، نويسنده , , T.U. Kampen and K. Horn، نويسنده , , W Hoyer، نويسنده , , D.R.T. Zahn، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    5
  • From page
    433
  • To page
    437
  • Abstract
    3,4,9,10-Perylene tetracarboxylic dianhydride (PTCDA) films were grown by organic molecular beam deposition (OMBD) under UHV conditions on hydrogen terminated Si(1 0 0) and sulphur passivated GaAs(1 0 0) surfaces. X-ray diffraction (XRD), X-ray reflectivity (XRR), Raman spectroscopy, and atomic force microscopy (AFM) are employed to study the influence of substrate surfaces on the structural properties of the organic films. Both phases of PTCDA, α- and β-polymorphs, are found to grow on both substrates. The substrate surfaces determine the preferential growth of α- and β-phases of PTCDA crystals at room temperature.
  • Keywords
    Organic film , XRD , Raman spectroscopy , AFM
  • Journal title
    Applied Surface Science
  • Serial Year
    2003
  • Journal title
    Applied Surface Science
  • Record number

    1000058