Title of article
Influence of substrate surfaces on the growth of organic films
Author/Authors
A Das، نويسنده , , G Salvan، نويسنده , , T.U. Kampen and K. Horn، نويسنده , , W Hoyer، نويسنده , , D.R.T. Zahn، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
433
To page
437
Abstract
3,4,9,10-Perylene tetracarboxylic dianhydride (PTCDA) films were grown by organic molecular beam deposition (OMBD) under UHV conditions on hydrogen terminated Si(1 0 0) and sulphur passivated GaAs(1 0 0) surfaces. X-ray diffraction (XRD), X-ray reflectivity (XRR), Raman spectroscopy, and atomic force microscopy (AFM) are employed to study the influence of substrate surfaces on the structural properties of the organic films. Both phases of PTCDA, α- and β-polymorphs, are found to grow on both substrates. The substrate surfaces determine the preferential growth of α- and β-phases of PTCDA crystals at room temperature.
Keywords
Organic film , XRD , Raman spectroscopy , AFM
Journal title
Applied Surface Science
Serial Year
2003
Journal title
Applied Surface Science
Record number
1000058
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