Title of article
Changes in the electronic structure of DiMePTCDI films on S-GaAs(1 0 0) upon exposure to oxygen
Author/Authors
Gianina Gavrila*، نويسنده , , Henry Me´ndez، نويسنده , , Thorsten U. Kampen، نويسنده , , Dietrich R.T. Zahn *، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
126
To page
130
Abstract
The electronic properties of N,N0-dimethyl-3,4,9,10-perylene tetracarboxylic diimide (DiMePTCDI) films deposited on
S-GaAs(1 0 0) surfaces are studied by ultraviolet photoelectron spectroscopy (UPS). The energy position of the highest
occupied molecular orbital (HOMO) of clean DiMePTCDI films is found to be at 2.04 0.10 eV with respect to Fermi level.
Exposure to oxygen results in a shift of the HOMO from its original position by 0.25 0.10 eV towards the middle of the band
gap. The shift explains the dramatic decrease of the current in the current–voltage (I–V) characteristics upon oxygen exposure of
Ag/DiMePTCDI/S-GaAs(1 0 0) Schottky diodes.
# 2004 Elsevier B.V. All rights reserved.
Keywords
Schottky contacts modification , organic materials , Energy level alignment
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
1000101
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