Title of article :
High-resolution photoemission study of the Si(111)/Au interface and its modification by a GaSe van der Waals termination layer
Author/Authors :
R. Fritsche، نويسنده , , B. Jaeckel، نويسنده , , A. Klein*، نويسنده , , W. Jaegermann، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
7
From page :
321
To page :
327
Abstract :
The GaSe half-sheet termination layer provides an epitaxial and chemical stable electronic passivation of the Si(111) surface. Gold was deposited on nþ- and p-doped Si(111):GaSe half-sheet terminated surfaces and the evolution of the Si(111):GaSe/Au interface and the Schottky barrier formation have been investigated. The GaSe half-sheet van der Waals surface termination on the Si(111) substrate do not modify the Si/Au Schottky barrier height but almost completely suppresses the Si/Au interface reaction at gold coverages <5 mL. The substrate chemical and electronic properties were investigated in-situ by high-resolution synchrotron excited X-ray photoelectron spectroscopy (SXPS). # 2004 Elsevier B.V. All rights reserved
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
1000134
Link To Document :
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