Title of article :
Influence of atomic-scale irregularities in fractal analysis of electrode surfaces
Author/Authors :
Ali Eftekhari، نويسنده , , Mahmood Kazemzad، نويسنده , , Mansoor Keyanpour-Rad، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
9
From page :
311
To page :
319
Abstract :
To clarify the vague points appeared in the literature, it was discussed that fractal analysis of electrode surfaces based on the concept of ‘diffusion toward electrode surfaces’ is only able to monitor surface roughness in scales larger than 10 nm. When inspecting fractality in atomic scale (and even up to 10 nm), electrochemical measurements are not reliable due to the presence of surface defects, which affect the electrochemical reaction. In other words, for fractal analysis of electrode surfaces, the diffusion layer width which acts as yardstick length, should be sufficiently large, incomparable to the scale of atomic inhomogeneities. To this aim, the experiment time should be sufficiently long or the diffusion coefficient should be sufficiently large.
Keywords :
Surface disorder , Atomic imperfection , Fractality scale , Diffusion layer , Length scale , Surface defects , SAXS , Cyclic voltammetry
Journal title :
Applied Surface Science
Serial Year :
2005
Journal title :
Applied Surface Science
Record number :
1000536
Link To Document :
بازگشت