Title of article :
Development of imaging energy analyzer using multipole Wien filter
Author/Authors :
H. Niimi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
4
From page :
131
To page :
134
Abstract :
We discussed a new design of aWien filter energy analyzer for an energy-filtered X-ray photoemission electron microscopy system. We have demonstrated that the second-order aberration and the third-order aperture aberration can be corrected by the multipole Wien filter by adjusting multipole components of electric and magnetic fields up to octupole components. The threedimensional charge simulation method indicated that 12 electrodes and magnetic poles can effectively reproduce these ideal electric and magnetic fields.
Keywords :
XPEEM , multipole , Aberration correction , Wien filter
Journal title :
Applied Surface Science
Serial Year :
2005
Journal title :
Applied Surface Science
Record number :
1000636
Link To Document :
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