Title of article :
Correlation between the growth-per-cycle and the surface
hydroxyl group concentration in the atomic layer deposition
of aluminum oxide from trimethylaluminum and water
Author/Authors :
Riikka L. Puurunena، نويسنده , , b، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
The growth-per-cycle (GPC) in the trimethylaluminum/water atomic layer deposition (ALD) process is shown to be
quantitatively correlated with the surface OH group concentration before the trimethylaluminum reaction. The correlation
corresponds to a reaction chemistry, where several types of gas–solid reactions (ligand exchange, dissociation/association) can
occur simultaneously, and where steric hindrance by adsorbed methyl groups terminates the trimethylaluminum reaction. The
commonly assumed reaction chemistry where one OH group bonds one aluminum atom through ligand exchange does not
describe satisfactorily the trimethylaluminum/water process, and should perhaps not be expected to describe other ALD
processes either
Keywords :
atomic layer deposition , Mechanism , High- dielectrics , Aluminum Oxide
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science