• Title of article

    Studying atomic-resolution by X-ray fluorescence holography

  • Author/Authors

    Hongyi Gao *، نويسنده , , Jianwen Chen، نويسنده , , Honglan Xie، نويسنده , , Huafeng Zhu، نويسنده , , Ruxin Li، نويسنده , , Zhizhan Xu، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    4
  • From page
    71
  • To page
    74
  • Abstract
    In this work, the results of numerical simulations of X-ray fluorescence holograms and the reconstructed atomic images for Fe single crystal are given. The influences of the recording angles ranges and the polarization effect on the reconstruction of the atomic images are discussed. The process for removing twin images by multiple energy fluorescence holography and expanding the energy range of the incident X-rays to improve the resolution of the reconstructed images is presented.
  • Keywords
    X-ray fluorescence holography , Atomic resolution , Multiple energy X-ray fluorescence holography , Numerical simulation
  • Journal title
    Applied Surface Science
  • Serial Year
    2005
  • Journal title
    Applied Surface Science
  • Record number

    1001180