Title of article :
Studying atomic-resolution by X-ray fluorescence holography
Author/Authors :
Hongyi Gao *، نويسنده , , Jianwen Chen، نويسنده , , Honglan Xie، نويسنده , , Huafeng Zhu، نويسنده , , Ruxin Li، نويسنده , , Zhizhan Xu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
4
From page :
71
To page :
74
Abstract :
In this work, the results of numerical simulations of X-ray fluorescence holograms and the reconstructed atomic images for Fe single crystal are given. The influences of the recording angles ranges and the polarization effect on the reconstruction of the atomic images are discussed. The process for removing twin images by multiple energy fluorescence holography and expanding the energy range of the incident X-rays to improve the resolution of the reconstructed images is presented.
Keywords :
X-ray fluorescence holography , Atomic resolution , Multiple energy X-ray fluorescence holography , Numerical simulation
Journal title :
Applied Surface Science
Serial Year :
2005
Journal title :
Applied Surface Science
Record number :
1001180
Link To Document :
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