IR and SFM study of PTCDA thin films on different substrates

FT-IR spectroscopy and SFM were used to investigate the growth of thin films of the organic semiconductor 3,4,9,10- perylenetetracarboxylicdianhydride (PTCDA) deposited by vacuum sublimation onto various substrates, i.e. Ag(111) layers on mica, KBr(100), mica, oxidized Si, and TiO2 nanoparticles on Si. Layer thicknesses of PTCDA varied from 10 to 1500 nm. The anhydride vibrations of PTCDA differ for the used substrates, which can be connected to the orientation of the molecules relative to the substrate surface and the film morphology as detected in the SFM pictures