High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7 d thin film by the low-temperature scanning microwave microscope

We developed a scanning microwave microscope (SmM) designed for high-throughput electric-property screening as well as for rapid construction of electronic phase diagrams at low temperatures. As a sensor probe, we used a high-Q l/4 coaxial cavity resonator to which a thin needle with ball-tip end was attached. The sensor module was mounted on the low-temperature XYZ stage, which allowed us to map out the change of resonance frequency and quality factor due to the local tip-sample interaction at low temperatures. From the measurements of combinatorial thin films, such as Ti1 xCoxO2 d and Nd0.9Ca0.1Ba2Cu3O7 d (NCBCO), it was demonstrated that this SmM system has enough performance for the high-throughput characterization of sample conductance under variable temperature conditions.