Title of article
Spectroscopy and imaging of metal–organic interfaces using BEEM
Author/Authors
Linda Kunardi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
3
From page
4020
To page
4022
Abstract
Charge injection from metal electrodes to organics is a subject of intense scientific investigation for organic electronics. Ballistic electron emission microscopy (BEEM) enables spectroscopy and imaging of buried interfaces with nanometer resolution. Spatial non-uniformity of carrier injection is observed for both Ag–PPP (poly-paraphenylene) and Ag–MEHPPV (poly-2-methoxy-5-2-ethyl-hexyloxy-1,4-phenylenevinylene) interfaces. BEEM current images are found to correlate only marginally with the surface topography of the Ag film.
Keywords
Hole injection , Interface , BEEM , Schottky barrier
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1001946
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