Title of article
The influence of chemical treatment and thermal annealing on AlxGa1 xN surfaces: An XPS study
Author/Authors
B. Boudjelida *، نويسنده , , M.C. Simmonds، نويسنده , , I. Gee، نويسنده , , S.A. Clark، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
8
From page
5189
To page
5196
Abstract
The influences of chemical treatment and thermal annealing of AlxGa1 xN (x = 0.20) have been investigated by X-ray
photoelectron spectroscopy (XPS). XPS analysis showed that successive chemical treatments and annealing produced changes
in the stoichiometry of the AlxGa1 xN surface, with the surface concentration of N increasing and Al and Ga decreasing with
increasing temperature. Band bending occurred at the AlxGa1 xN surface, in parallel with the observed changes in
stoichiometry. These results are discussed in the context of the creation of surface states via the activation of vacancies
and induced by defects. These findings point towards the possibility of selecting and/or engineering the band structure at
AlxGa1 xN surfaces through a combination of surface preparation and annealing.
Keywords
annealing , AlGaN , Fermi level pinning , Surface
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002132
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