Title of article :
G-SIMS-FPM: Molecular structure at surfaces—a combined
positive and negative secondary ion study
Author/Authors :
I.S. Gilmore، نويسنده , , F.M. Green *، نويسنده , , M.P. Seah، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Abstract :
G-SIMS is an easy to use method that considerably simplifies complex static SIMS spectra. The G-SIMS peaks relate directly to the parent
molecular structure and so provide a library independent method for direct interpretation and identification. For larger molecules (>100 u) the
mass alone may be insufficient to identify the molecule unambiguously. A development of G-SIMS, G-SIMS-fragmentation pathway mapping
(FPM), solves this problem. G-SIMS-FPM allows the molecular structure to be re-assembled by following fragmentation pathways as the G-SIMS
surface plasma temperature is varied. In this study, we develop the inclusion of negative secondary ion fragmentation data to provide a more
complete analysis. This approach is exampled with data for complex molecules of Irganox 1010 and folic acid.
Keywords :
Identification , interpretation , Static SIMS , Molecular structure , G-SIMS
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science