Title of article :
Information from complexity: Challenges of TOF-SIMS data interpretation
Author/Authors :
Daniel J. Graham، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
9
From page :
6860
To page :
6868
Abstract :
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) data are complex, even for the simplest systems. Yet it is within this complexity that information about sample composition, molecular orientation, surface order, chemical bonding, sample purity, etc., is contained. The challenge is how to easily extract this information from the spectra and images. Multivariate analysis (MVA) has shown promise in taming the complexity challenges presented by TOF-SIMS data while using all the information in the entire spectrum. The recent success of MVA methods such as principal component analysis (PCA) and partial least squares (PLS) in the spectroscopic and imaging analysis of organic and biological materials has led to a great increase in the interest of MVA processing of TOF-SIMS data. However, there is still a need to better understand what data to use to answer a given question, how to optimally process the data before applyingMVA, and how to correctly interpret theMVA results. The challenges of TOF-SIMS data interpretation will only get more complex, especially for biological samples, further increasing the need for wellcontrolled MVA methodologies.
Keywords :
Multivariate analysis , Adsorbed proteins , ToF-SIMS , Principal component analysis , Self-assembled monolayers
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002452
Link To Document :
بازگشت