Title of article :
The electron counting rule and passivation of compound semiconductor surfaces
Author/Authors :
G.P. Srivastava، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
8
From page :
7600
To page :
7607
Abstract :
A brief review is presented of the role of electron counting rule (ECR) in explaining structural stability and passivation of compound semiconductor surfaces. While III–V(1 1 0) and majority of III–V(0 0 1) and III–V(1 1 1) surfaces reconstruct in accordance with the ECR, there are a few low- and high-index surfaces which disobey the ECR but stabilize by sustaining significant elastic deformation in the surface region.We explain the latter scenario with the help of computational results for the geometric and electronic structure of GaSb(0 0 1)-(1 3), GaSb(0 0 1)- c(2 6), InP(1 1 1)A-( ffiffiffi 3 p ffiffiffi 3 p ), and GaAs(1 1 1)B–Sb(1 3).We also discuss hydrogen passivation of these surfaces. It is pointed out that the recently observed stable InP(1 1 1)A-( ffiffiffi 3 p ffiffiffi 3 p ) surface can be both chemically and electronically passivated by exposing it to a hydrogen gas of one quarter of a monolayer coverage
Keywords :
Surface reconstructions , Pseudopotential method1. IntroductionThe importance of semiconductor surfaces and interfaces intechnologically important device applications is well established.In particular , substrates of compound semiconductors , Compound semiconductor surfaces , such as zinc-blende III–Vs , and exploit , are believed to be very important inthe development of wireless communications and optoelectronicstechnology. In order to fully understand , such substrates , Surface passivation , Density functional theory
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002592
Link To Document :
بازگشت