Author/Authors :
Chun Yan Miao، نويسنده , , Zhizhen Ye، نويسنده , , Weizhong Xu، نويسنده , , Fugang Chen، نويسنده , , Xincui Zhou، نويسنده , , Binghui Zhao، نويسنده , , Liping Zhu، نويسنده , , Jianguo Lu، نويسنده ,
Abstract :
Phosphorus-doped p-type ZnO thin films have been realized by metalorganic chemical vapor deposition (MOCVD). The conduction type of
ZnO films is greatly dependent on the growth temperature. ZnO films have the lowest resistivity of 11.3 Vcm and the highest hole concentration of
8.84 1018 cm 3 at 420 8C. When the growth temperature is higher than 440 8C, p-type ZnO films cannot be achieved. All the films exhibited ptype
conduction after annealing, and the electrical properties were improved comparing with the as-grown samples. Secondary ion mass
spectroscopy (SIMS) test proved that phosphorus (P) has been incorporated into ZnO.
Keywords :
p-Type conduction , Doping , Metalorganic chemical vapor deposition , Zinc compounds , Semiconducting II–VI materials