Title of article :
p-Type conduction in phosphorus-doped ZnO thin films by MOCVD and thermal activation of the dopant
Author/Authors :
Chun Yan Miao، نويسنده , , Zhizhen Ye، نويسنده , , Weizhong Xu، نويسنده , , Fugang Chen، نويسنده , , Xincui Zhou، نويسنده , , Binghui Zhao، نويسنده , , Liping Zhu، نويسنده , , Jianguo Lu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
4
From page :
7953
To page :
7956
Abstract :
Phosphorus-doped p-type ZnO thin films have been realized by metalorganic chemical vapor deposition (MOCVD). The conduction type of ZnO films is greatly dependent on the growth temperature. ZnO films have the lowest resistivity of 11.3 Vcm and the highest hole concentration of 8.84 1018 cm 3 at 420 8C. When the growth temperature is higher than 440 8C, p-type ZnO films cannot be achieved. All the films exhibited ptype conduction after annealing, and the electrical properties were improved comparing with the as-grown samples. Secondary ion mass spectroscopy (SIMS) test proved that phosphorus (P) has been incorporated into ZnO.
Keywords :
p-Type conduction , Doping , Metalorganic chemical vapor deposition , Zinc compounds , Semiconducting II–VI materials
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002648
Link To Document :
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