Title of article
Ge1–xCx double-layer antireflection and protection coatings
Author/Authors
C.Q. Hu، نويسنده , , W.T. Zheng and Chang Q. Sun، نويسنده , , J.J. Li، نويسنده , , Q. Jiang، نويسنده , , H.W. Tian، نويسنده , , X.Y. Lu، نويسنده , , J.W. Liu ، نويسنده , , L. Xu، نويسنده , , J.B. Wang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
8135
To page
8138
Abstract
The antireflection Germanium carbide (Ge1–xCx) coating, deposited using RF reactive sputtering, on both sides of ZnS substrate wafer has been
developed. The infrared (IR) transmittance spectra show that the IR transmittance in the wavelength region between 8 and 12 mm for the designed
system Ge1–xCx/ZnS/Ge1–xCx is greatly enhanced compared to that for ZnS substrate. In addition, the double-layer coated ZnS substrate is
approximately four times as hard as uncoated ZnS substrate. This investigation indicates that a double-layer Ge1–xCx coating can be used as an
effective antireflection and protection coating on ZnS infrared window
Keywords
rf Reactive sputtering , Zinc sulphide , Ge1–xCx films , Antireflection and protection coatings
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002681
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