Title of article :
Structural distortion in thiourea-mixed ADP crystals
Author/Authors :
A. Jayarama *، نويسنده , , S.M. Dharmaprakash، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Abstract :
Single crystals of ammonium dihydrogen phosphate (ADP) mixed with different mole concentrations of thiourea were grown using slow
evaporation solution technique at 30 8C. In order to study the effect of mixing thiourea on the structural characteristics of ADP, X-ray diffraction
studies were carried out on the crystals using Shimadzu X-ray diffractometer with Cu Ka radiation. X-ray study revealed that the structures of the
thiourea-mixed ADP are slightly distorted compared to the pure ADP crystal structure. Inclusion of thiourea enhances the growth of (¯1 0 0) plane of
the ADP crystal. Thiourea-mixed ADP crystals were found to have maximum inclusion, as the thiourea concentration was 10 mol%.
Keywords :
NON-LINEAR , X-ray diffraction
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science