Title of article :
Structural distortion in thiourea-mixed ADP crystals
Author/Authors :
A. Jayarama *، نويسنده , , S.M. Dharmaprakash، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
6
From page :
944
To page :
949
Abstract :
Single crystals of ammonium dihydrogen phosphate (ADP) mixed with different mole concentrations of thiourea were grown using slow evaporation solution technique at 30 8C. In order to study the effect of mixing thiourea on the structural characteristics of ADP, X-ray diffraction studies were carried out on the crystals using Shimadzu X-ray diffractometer with Cu Ka radiation. X-ray study revealed that the structures of the thiourea-mixed ADP are slightly distorted compared to the pure ADP crystal structure. Inclusion of thiourea enhances the growth of (¯1 0 0) plane of the ADP crystal. Thiourea-mixed ADP crystals were found to have maximum inclusion, as the thiourea concentration was 10 mol%.
Keywords :
NON-LINEAR , X-ray diffraction
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002952
Link To Document :
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