Title of article :
Understanding deviations in lithographic patterns near interfaces:
Characterization of bottom anti-reflective coatings (BARC) and
the BARC–resist interface
Author/Authors :
Joseph L. Lenhart، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Abstract :
Interactions between a bottom anti-reflective coating (BARC) and a photoresist can critically impact lithographic patterns. For example, a
lithographic pattern can shrink or spread near a BARC interface, a process called undercutting or footing respectively, due to incompatibility
between the two materials. Experiments were conducted on two industrial BARC coatings in an effort to determine the impact of BARC surface
chemistry on the footing and undercutting phenomena. The BARC coatings were characterized by near edge X-ray absorption fine structure
(NEXAFS), contact angle measurements, and neutron and X-ray reflectivity. Contact angle measurement using a variety of fluids showed that the
fluid contact angles were independent of the type of BARC coating or the BARC processing temperature. NEXAFS measurements showed that the
surface chemistry of each BARC was also independent of the processing temperature. These results suggest that acid–base interactions at the
BARC–resist interface are not the cause of the footing–undercutting phenomena encountered in lithographic patterns.
Keywords :
Undercutting , BARC , lithography , Anti-reflective coating , Footing , Interface , Photolithography , photoresist
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science