Title of article
The effect of solvent upon molecularly thin rotaxane film formation
Author/Authors
Alan A. Farrell، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
6
From page
6090
To page
6095
Abstract
We have investigated variations in molecularly thin rotaxane films deposited by solvent evaporation, using atomic force microscopy (AFM).
Small changes in rotaxane structure result in significant differences in film morphology. The addition of exo-pyridyl moietes to the rotaxane
macrocycle results in uniform domains having orientations corresponding to the underlying substrate lattice, while a larger, less symmetric
molecule results in a greater lattice mismatch and smaller domain sizes. We have measured differences in film heights both as a function of the
solvent of deposition and as a function of surface coverage of rotaxanes. Based on these observations we describe how the use of solvents with
higher hydrogen-bond basicity results in films which are more likely to favour sub-molecular motion
Keywords
thin-films , Atomic force microscopy , rotaxane , solvent , conformation , Hydrogen bond
Journal title
Applied Surface Science
Serial Year
2007
Journal title
Applied Surface Science
Record number
1003781
Link To Document