Title of article :
The effect of solvent upon molecularly thin rotaxane film formation
Author/Authors :
Alan A. Farrell، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Abstract :
We have investigated variations in molecularly thin rotaxane films deposited by solvent evaporation, using atomic force microscopy (AFM).
Small changes in rotaxane structure result in significant differences in film morphology. The addition of exo-pyridyl moietes to the rotaxane
macrocycle results in uniform domains having orientations corresponding to the underlying substrate lattice, while a larger, less symmetric
molecule results in a greater lattice mismatch and smaller domain sizes. We have measured differences in film heights both as a function of the
solvent of deposition and as a function of surface coverage of rotaxanes. Based on these observations we describe how the use of solvents with
higher hydrogen-bond basicity results in films which are more likely to favour sub-molecular motion
Keywords :
thin-films , Atomic force microscopy , rotaxane , solvent , conformation , Hydrogen bond
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science