Title of article
High sensitivity IR spectroscopic methods of self-assembling monolayers (SAM) measurements
Author/Authors
A. Inberg *، نويسنده , , N. Croitoru، نويسنده , , G. Revzin، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
3
From page
6784
To page
6786
Abstract
New systems of coupling the FTIR spectrum signal amplification, mainly for self-assembling monolayers (SAMs) investigation, were
developed. These systems based on hollow waveguide (HW) or half cylinder mirror, which have negligible attenuation in the mid infrared; enable
to obtain high signal sensitivity of the samples absorption due to the very high signal to noise ratio. This has lead more detailed characterization of
the SAMs molecular structure and its modifications. In addition, a linear dependence of the signal on the number of IR radiation rays incidents on
length of HW, which has resulted in simple interpretation of results, was obtained.
Keywords
Spectral absorption , FTIR spectroscopy , sensitivity , thiol , SAM
Journal title
Applied Surface Science
Serial Year
2007
Journal title
Applied Surface Science
Record number
1003896
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