Title of article :
Microstructure and nanohardness of the diluted magnetic semiconducting Cd1 xMnxS nano-crystalline films
Author/Authors :
D. Sreekantha Reddy، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
5
From page :
7318
To page :
7322
Abstract :
Cd1 xMnxS nano-crystalline films (0 x 0.5) were formed on glass substrates by thermal evaporation technique at room temperature (300 K). AFM studies showed that all the films were in nano-crystalline form with the grain size varying in the range between 36 and 58 nm and exhibited hexagonal structure of the host material. The lattice parameters varied linearly with composition, following Vegard’s law in the entire composition range. The nanohardness and Young’s modulus decreased sharply with ‘Mn’ content upto x = 0.3 and increased with high Mn content
Keywords :
Nanohardness and Young’s modulus , Cd1 xMnxS nano-crystalline films , Microstructure , Diluted magnetic semiconductors
Journal title :
Applied Surface Science
Serial Year :
2007
Journal title :
Applied Surface Science
Record number :
1003983
Link To Document :
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