Title of article :
X-ray photoelectron spectroscopic studies on phase identification and quantification of nickel aluminides
Author/Authors :
Naofumi Ohtsu *، نويسنده , , Masaoki Oku، نويسنده , , TOETSU SHISHIDO، نويسنده , , Kazuaki Wagatsuma، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
5
From page :
8713
To page :
8717
Abstract :
Core-level XPS spectra for clean surfaces of Ni3Al, NiAl, and NiAl3 alloys were studied. The clean surfaces were obtained by fracturing in the ultra-high vacuum chamber. The positive chemical shifts of Ni 2p3/2 peak for NiAl and NiAl3 from Ni metal were 0.2 and 1.0 eV, respectively. The negative shift for Al 2p peak and the positive shift for Ni 3p peaks increased with the decreasing concentration of the corresponding elements. The peak position of the bulk plasmon loss peak for Al 2s peak shifted toward higher energy side, and further, the intensity ratio decreased with the decrease in aluminum concentration. Both the peak intensity ratios of Al 2p to Ni 3p determined by factor analysis and convenient separation are proportional to the atomic ratio of aluminum to nickel. The results indicate that the intensity ratio of Al 2p to Ni 3p determined by these two methods can be applied to the quantification for the surface of the nickel–aluminum alloys.
Keywords :
Quantification , Chemical shift , Core-level XPS spectra , Fracturing , Nickel aluminides
Journal title :
Applied Surface Science
Serial Year :
2007
Journal title :
Applied Surface Science
Record number :
1004237
Link To Document :
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