Laser ablation of CsI analyzed by delayed extraction

Secondary ion emission from polycrystalline CsI irradiated by pulsed-UV laser (337 nm) is analyzed by time-of-flight (TOF) mass spectrometry. Measurements were performed for different laser intensities and for several delayed extraction times (0–200 ns). The TOF peak shape is characterized by a Gaussian-like structure (fast component), followed by a tail (slow component) that is more pronounced when the extraction field is delayed. A thermal-sputtering uni-dimensional model is employed to describe the solid surface and plasma temperatures as a function of time. Heat diffusion, vapor photo-ionization, radiative emission and plume expansion are considered. Within the approximations used, the model predicts reasonable drift velocities of the plume (≈1.4 km s−1) but very high plasma temperatures (≈105 K). The width of the TOF peak fast component allows determination of the plume temperature during its expansion.