Title of article
Microwave excitation and readout of nano- and micron scale cantilevers
Author/Authors
Ling Hao، نويسنده , , Stefan Goniszewski، نويسنده , , Jie Chen، نويسنده , , John Gallop، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
4
From page
2192
To page
2195
Abstract
We show that a microwave near-field coaxial resonator system allows mechanical cantilever excitation on a scale much shorter than the microwave wavelength. Thermal noise is observed in the unexcited system, enabling room temperature displacement sensitivity of ∼70 fm/Hz1/2. The measured force between near-field probe and cantilever varies with separation, in excellent agreement with theory. Uniquely, optical excitation and read-out lasers are also included. The dependence of mechanical resonator quality factor on ambient air pressure has been accurately measured. We have demonstrate passive cantilever mode cooling from 300 K to 80 K by frequency detuning the microwave resonator and propose pulsed cooling operation to enable several high-sensitivity applications.
Keywords
NEMS , Near-field microwave microscope , Cantilever , MEMS
Journal title
Applied Surface Science
Serial Year
2012
Journal title
Applied Surface Science
Record number
1004430
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