Title of article
F2-laser modification and patterning of silicone films
Author/Authors
R. A. Syring، نويسنده , , T. Fricke-Begemann، نويسنده , , J. Ihlemann، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
7
From page
68
To page
74
Abstract
Pulsed laser irradiation of 3 μm thick silicone films at 157 nm below and above the ablation threshold of about 100 mJ/cm2 has been investigated. Significantly above the ablation threshold, clean material removal is observed. Irradiation below threshold leads to surface swelling and a modification of the chemical composition as revealed by Raman spectroscopy. After 10,000 pulses at 30 mJ/cm2 a nearly carbon free silica like material is obtained. The 157 nm-ablation threshold of this modified material amounts to 800 mJ/cm2, which is similar to that of fused silica. At 60 mJ/cm2, the CH3-content is similarly reduced, but a graphitization is observed after about 10 000 pulses. In both cases the modified material exhibits broadband visible luminescence. Combinations of modification and ablation are used to fabricate patterned silica films.
Keywords
F2-laser , Modification , Silica , Ablation , Swelling , Silicone
Journal title
Applied Surface Science
Serial Year
2012
Journal title
Applied Surface Science
Record number
1005874
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