Title of article
The effect of X-ray photoelectron spectroscopy measurement on P(VDF-TrFE) copolymer thin films
Author/Authors
Dipankar Mandal، نويسنده , , Caroline E. H. Dessent and Klaus Müller-Dethlefs، نويسنده , , Karsten Henkel، نويسنده , , Dieter Schmei?er، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
5
From page
209
To page
213
Abstract
The impact of prolonged X-ray irradiation during X-ray photoelectron spectroscopy (XPS) measurement was investigated on poly(vinylidene-trifluoroethylene) (P(VDF-TrFE)) thin films. It was observed that prolonged X-ray irradiation can accelerate the crosslinking of P(VDF-TrFE) and diminish the ferroelectric phase. Fourier transform infrared spectroscopy (FT-IR) data indicate that the ferroelectric phase diminishes completely after 360 kJ of X-ray irradiation dose and it induces the paraelectric phase. In this work, the main emphasis was given to the optimization of the X-ray irradiation dose during XPS measurements to maintain the ferroelectric phase within the copolymer films.
Keywords
P(VDF-TrFE) copolymer thin film , XPS measurement , X-ray irradiation , Ferroelectric to paraelectric phase transformation
Journal title
Applied Surface Science
Serial Year
2012
Journal title
Applied Surface Science
Record number
1005894
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