Title of article :
TOF-SIMS study on surface modification of reed switch blades by pulsing nitrogen plasma
Author/Authors :
N. Yasavol، نويسنده , , A. Abdollah-zadeh، نويسنده , , E. Bahrami Samani and M. Ganjali، نويسنده , , S.A. Alidokht، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
6
From page :
642
To page :
647
Abstract :
A TOF.SIMS-5 by ION-TOF operating with pulsed 25 keV Bi+ for analysis and 2 keV Cs+ for sputtering was used to study depth compositional changes in near-surface layers of permalloy (iron–nickel) blades after treatment by pulsed nitrogen plasma directly in sealed reed switches. The formation of 350 nm-thick oxy-nitride coating in the contacting region of the blades was observed. It was found that the origin of this coating cannot be explained just by nitrogen and oxygen diffusion inside the treated material. Rather, cathode sputtering and re-deposition of sputtered products, thermal decomposition of nitrides and oxides along with sputter-induced surface roughening can also contribute in the formation of the modified layers.
Keywords :
Ion-plasma treatment , Nitriding , Reed switch , Sputter depth profiling , Time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Journal title :
Applied Surface Science
Serial Year :
2013
Journal title :
Applied Surface Science
Record number :
1006419
Link To Document :
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