Electrochemical anodic oxidation of nitrogen doped carbon nanowall films: X-ray photoelectron and Micro-Raman spectroscopy study

Unintentional nitrogen doped carbon nanowall (CNW) films were oxidized through anodic polarization in different applied potential windows, in a mild neutral K2SO4 electrolyte solution. Applied potentials in the range of [0–1], [0–1.5] and [0–2] V vs. SCE were explored. The films were characterized with X-ray photoelectron (XPS) and Micro-Raman spectroscopy, in order to investigate the surface chemistry and structural changes after treatment, respectively. The XPS analysis revealed that this electrochemical treatment leads to an increase of oxygen functional groups, and influences the nitrogen proportion and bonding configuration (such as pyridinic/pyridonic nitrogen) on the film surface at room temperature. In particular, an obvious enhancement of pyrrolic/pyridonic nitrogen doping of CNWs via electrochemical cycling in the range of [0–1.5] and [0–2] V vs. SCE was achieved. Such enhancement happened, because of the oxidation of nitrogen atoms in pyridine as a result of OH ions injection upon electrochemical cycling. Micro-Raman analysis indicates structural quality degradation with increasing the applied potential window. Moreover, the electrochemical capacitance of CNW films was increased after treatment in the range of [0–1] and [0–1.5] and decreased in the range of [0–2] V vs. SCE. The results show that harsh oxidation happened in the range [0–2] V.