Author/Authors :
R. Santos، نويسنده , , J. Loureiro، نويسنده , , A. Nogueira، نويسنده , , E. Elangovan*، نويسنده , , J.V. Pinto، نويسنده , , J.P. Veiga، نويسنده , , T. Busani، نويسنده , , E. Fortunato، نويسنده , , R. Martins، نويسنده , , I. Ferreira، نويسنده ,
Abstract :
This work reports the structural, optical, electrical and thermoelectric properties of vanadium pentoxide (V2O5) thin films deposited at room temperature by thermal evaporation on Corning glass substrates. A post-deposition thermal treatment up to 973 K under atmospheric conditions induces the crystallization of the as-deposited amorphous films with an orthorhombic V2O5 phase with grain sizes around 26 nm. As the annealing temperature rises up to 773 K the electrical conductivity increases. The films exhibit thermoelectric properties with a maximum Seebeck coefficient of −218 μV/K and electrical conductivity of 5.5 (Ω m)−1. All the films show NIR-Vis optical transmittance above 60% and optical band gap of 2.8 eV.
Keywords :
Vanadium pentoxide , Thermal evaporation , Thin films , Thermoelectric properties
