Author/Authors :
K.V. Gurav b، نويسنده , , S.M. Pawar، نويسنده , , Seung Wook Shin a، نويسنده , , M.P. suryawanshi، نويسنده , , G.L. Agawane، نويسنده , , P.S. Patil، نويسنده , , Jong Ha Moon، نويسنده , , J.H. Yun، نويسنده , , Jin Hyeok Kim b، نويسنده ,
Abstract :
In the present work, CZTS thin films have been prepared by sulfurization of electrodeposited Cu–Zn–Sn (CZT) precursor. Prior to sulfurization, as-deposited CZT precursors have been soft annealed in Ar atmosphere at different temperatures (250–350 °C). The structural, morphological, compositional and optical properties of the films have been investigated in detail. It is found that, soft annealing temperature has a significant impact on the properties of CZTS thin films. The systematic study on the improvement in the properties of CZTS films using soft annealing route has been studied and discussed.
Keywords :
X-ray diffraction , Cu2ZnSnS4 (CZTS) thin films , Soft annealing , Electrodeposition , Cyclic voltammetry (CV)
