• Title of article

    Scanning tunneling microscopy investigations of silicon carbide nanowires

  • Author/Authors

    A. Busiakiewicz، نويسنده , , Z. Klusek، نويسنده , , A. Huczko، نويسنده , , P.J. Kowalczyk، نويسنده , , P. D?browski، نويسنده , , J. W. Kozlowski، نويسنده , , S. Cudzi?o، نويسنده , , P.K. Datta، نويسنده , , W. Olejniczak، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    5
  • From page
    4268
  • To page
    4272
  • Abstract
    Scanning tunneling microscopy (STM) images have been obtained from the surfaces of silicon carbide nanowires produced in the thermolysis-induced carbonization of halocarbons (combustion synthesis). The morphology of the nanowires shows trench-like features perpendicular to the fibres’ axis, which is assigned to the existence of microfacets on their sidewalls. For the first time high-resolution STM images of the SiC nanowires are presented. The results are in agreement with the previous reports suggesting the presence of microfacets on the SiC whiskers’ surface.
  • Keywords
    Silicon carbide , Nanowires , Scanning tunneling microscopy , Nanofibres
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1009152