Title of article :
Growth mechanism and characterisation of chemically grown Sb doped Bi2Se3 thin films
Author/Authors :
N.S. Patil، نويسنده , , A.M. Sargar، نويسنده , , S.R. Mane، نويسنده , , P.N. Bhosale، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Abstract :
The synthesis of combinatorial Bi2−xSbxSe3 thin films by arrested precipitation technique (APT) using triethanolamine-bismuth, triethanolamine-antimony and sodium selenosulphite as sources of Bi3+, Sb3+ and Se2−, respectively is investigated on commercial glass substrates. The growth mechanism of film formation, composition and surface morphology of the as deposited films were studied as a function of preparative parameters and bath composition. The films were monophasic, polycrystalline and covered the surface of the substrate completely. Energy dispersive X-ray analysis gave coherent elemental composition indicating single phase BiSbSe3 was made. The good results obtained for Bi2−xSbxSe3 thin films revealed that arrested precipitation technique is best suited for the deposition of large area thin films on conducting/nonconducting substrates to produce materials for device applications.
Keywords :
Thin films , Bi2?xSbxSe3 , XRD , SEM
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science