Title of article :
X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C60 films
Author/Authors :
Amit Kumar، نويسنده , , F. Singh ، نويسنده , , Govind، نويسنده , ,
S.M Shivaprasad، نويسنده , , D.K. Avasthi
، نويسنده , , J.C. Pivin، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Abstract :
The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopies are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp2 to sp3 conversion) and reduction of π electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence.
Keywords :
Ion irradiation , Fullerene , X-ray photoelectron spectroscopy , X-ray-induced Auger electron spectroscopy
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science