Circular dichroism of forward focusing peaks and diffraction rings in 2image steradian Si 2p photoelectron pattern

2 image steradian Si 2p photoelectron pattern from Si(0 0 1) surface was measured. The circular dichroism of rotational shift around the incident-light axis was observed. Shifts for the forward focusing peaks in image and image directions were inversely proportional to the distance between the emitter atom and neighboring atoms in image and image directions, respectively. These shifts correspond to the parallax in stereograph of the atomic arrangements. On the other hand, such rotational shifts were not observed in image directions due to the first order diffraction rings around image directions. A gross feature of Si 2p photoelectron pattern can be explained by forward focusing peaks and first order diffraction rings around them.