Title of article
Effects of surface roughness on the electrical characteristics of ZnO nanowire field effect transistors
Author/Authors
Woong-Ki Hong، نويسنده , , Sunghoon Song، نويسنده , , Dae-Kue Hwang، نويسنده , , Soon-Shin Kwon، نويسنده , , Gunho Jo، نويسنده , , Seong-Ju Park، نويسنده , , Takhee Lee، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
6
From page
7559
To page
7564
Abstract
We have systematically investigated the effects of surface roughness on the electrical characteristics of ZnO nanowire field effect transistors (FETs) before and after passivation by poly (methyl metahacrylate) (PMMA), a polymer-insulating layer. To control the surface morphology of ZnO nanowires, ZnO nanowires were grown by the vapor transport method on two different substrates, namely, an Au-catalyzed sapphire and an Au-catalyzed ZnO film/sapphire. ZnO nanowires grown on the Au-catalyzed sapphire substrate had smooth surfaces, whereas those grown on the Au-catalyzed ZnO film had rough surfaces. Electrical characteristics such as the threshold voltage shift and transconductance before and after passivation were strongly affected by the surface morphology of ZnO nanowires.
Keywords
Passivation , ZnO , Nanowire , Field effect transistor , Surface roughness
Journal title
Applied Surface Science
Serial Year
2008
Journal title
Applied Surface Science
Record number
1009748
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