• Title of article

    Effects of surface roughness on the electrical characteristics of ZnO nanowire field effect transistors

  • Author/Authors

    Woong-Ki Hong، نويسنده , , Sunghoon Song، نويسنده , , Dae-Kue Hwang، نويسنده , , Soon-Shin Kwon، نويسنده , , Gunho Jo، نويسنده , , Seong-Ju Park، نويسنده , , Takhee Lee، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    6
  • From page
    7559
  • To page
    7564
  • Abstract
    We have systematically investigated the effects of surface roughness on the electrical characteristics of ZnO nanowire field effect transistors (FETs) before and after passivation by poly (methyl metahacrylate) (PMMA), a polymer-insulating layer. To control the surface morphology of ZnO nanowires, ZnO nanowires were grown by the vapor transport method on two different substrates, namely, an Au-catalyzed sapphire and an Au-catalyzed ZnO film/sapphire. ZnO nanowires grown on the Au-catalyzed sapphire substrate had smooth surfaces, whereas those grown on the Au-catalyzed ZnO film had rough surfaces. Electrical characteristics such as the threshold voltage shift and transconductance before and after passivation were strongly affected by the surface morphology of ZnO nanowires.
  • Keywords
    Passivation , ZnO , Nanowire , Field effect transistor , Surface roughness
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1009748