Author/Authors :
Yusaku Iwasawa، نويسنده , , Wolfgang Voegeli، نويسنده , , Tetsuroh Shirasawa، نويسنده , , Kouji Sekiguchi، نويسنده , , Takehiro Nojima، نويسنده , , Ryuji Yoshida، نويسنده , , Toshio Takahashi، نويسنده , , Masuaki Matsumoto، نويسنده , , Tatsuo Okano، نويسنده , , Koichi Akimoto، نويسنده , , Hiroshi Kawata، نويسنده , , Hiroshi Sugiyama، نويسنده ,
Abstract :
The structure of buried Si(1 1 1)-5 × 2-Au capped with amorphous Si was investigated using surface X-ray diffraction. It was found that the 5 × 2 structural periodicity is kept under the amorphous Si from the in-plane measurement. Furthermore, the intensity variation along the fractional-order rod indicates that Au atoms are located almost on the same plane.
