Mapping hard magnetic recording disks by TOF-SIMS

Mapping of hard magnetic recording disks by TOF-SIMS was performed both to produce significant analytical results for the understanding of the disk surface and the head disk interface in hard disk drives, and as an example of a macroscopic non-rectangular mapping problem for the technique. In this study, maps were obtained by taking discrete samples of the disk surface at set intervals in R and Θ. Because both in manufacturing, and in the disk drive, processes that may affect the disk surface are typically circumferential in nature, changes in the surface are likely to be blurred in the Θ direction. An algorithm was developed to determine the optimum relative sampling ratio in R and Θ. The results confirm what the experience of the analysts suggested, that changes occur more rapidly on disks in the radial direction, and that more sampling in the radial direction is desired. The subsequent use of statistical methods principle component analysis (PCA), maximum auto-correlation factors (MAF), and the algorithm inverse distance weighting (IDW) are explored.